Kelli MarakovitsJune 22nd, 2018
It's that time of year again when we pack up our bags and head to BILT North America. This year’s event will take place August 9-11, 2018 in St. Louis, Missouri and features speakers from around the country, including CADD Microsystem’s own Jason Kunkel, Chris Lindo and Purvi Gandhi Irwin.
BILT (formerly known as the Revit Technology Conference) is 3-day educational and networking event, designed for those who build, operate, design and maintain our built environment. Dedicated to improving the way the industry works together, the conference is a great opportunity for users to explore the latest technology and industry trends, learn from the top experts in the field, gain valuable insights from local and international users, and have a little fun!
Sessions presented by speakers from CADD Microsystems
Chris Lindo, our Applications Specialist, will present two sessions this year during his first appearance at BILT. His first session takes a look at FM Systems and Revit: Modeling for Facility Management. Then it's on to Bluebeam Revu in his second session that focuses on generating and working with 3D PDFs.
Jason Kunkel, our AEC Manager, will take the BILT stage for the third year in a row. Follow along as he dives into the Autodesk COBie Extension for Revit and the Autodesk Classification Manager for Revit and explains the connectivity between COBie and major classification systems within your model.
Purvi Gandhi Irwin, our Senior Application Specialist, will lead a discussion on BIM (Building Information Modeling) and how to take schedules to the next level. She then teams up with Heather Worrell from Ratio Architects for a session titled Women in BIM Panel: The Business Case for Diversifying your BIM Staff.
See the full 2018 schedule of events here.
We are thrilled to be a part of the 17th annual BILT! Let us know in the comments below if you will be joining us in St. Louis. Be sure to follow us on Twitter (@CADD) for updates from the road and be on the lookout for future blog posts from our speakers at the conference.